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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
A comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers.
Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Item #: 4679890

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Item #: 4679890

AED 308

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    A comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers.
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    What Stands Out

    Comprehensive Coverage
    This edition offers extensive insights into both Electron Microprobe Analysis and Scanning Electron Microscopy techniques, making it an invaluable resource for geologists seeking to enhance their analytical skills and techniques.
    Practical Applications
    It emphasizes practical applications of SEM and EMP in geology, addressing real-world challenges and providing solutions, which helps professionals improve their research and analysis capabilities effectively.
    Updated Techniques
    Incorporating the latest advancements in technology and methodologies, this book equips readers with current knowledge, ensuring they stay competitive and informed in the evolving field of geological analysis.

    Product Details

    Shop Electron Microprobe Analysis and Scanning Electron Microscopy in Geology online at a best price in UAE. 052114230X
    Publisher Cambridge University Press
    Publication date June 10, 2010
    Edition 2nd
    Language English
    Print length 212 pages
    ISBN-10 052114230X
    ISBN-13 978-0521142304
    Item Weight 12 ounces (340.2 grams)
    Dimensions 6.69 x 0.48 x 9.61 inches (17 x 1.2 x 24.4 cm)

    Who Should Buy?

    Suitable For
    • Geology Students

      Ideal for geology students seeking comprehensive knowledge on electron microprobe analysis and scanning electron microscopy techniques.

    • Research Professionals

      Beneficial for researchers focusing on mineralogy, petrology, and materials science utilizing advanced imaging and analytical techniques.

    • Laboratory Technicians

      A useful resource for laboratory technicians who operate electron and scanning electron microscopes in geological studies.

    Not Suitable For
    • Casual Readers

      May not appeal to casual readers seeking easily digestible content rather than in-depth technical material.

    Product Description

    Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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    Geology Editorial Review

    **** The second edition of "Electron Microprobe Analysis and Scanning Electron Microscopy in Geology" has been well received by readers, particularly those in the geological sciences. Its primary strength lies in its ability to provide a clear and concise overview of Scanning Electron Microscopy (SEM) and electron microprobe techniques. Reviewers appreciate that while the book could delve deeper into the physics underpinning these methods, it remains focused on their diverse geological applications. This makes it a practical resource for both students and professional geologists alike, who may require an accessible introduction to these analytical tools without becoming overwhelmed by overly technical content. Readers have noted its readability and thoroughness, often mentioning how it effectively meets their specific needs in the field. The book is touted as an excellent overview, highlighting its functionality as a useful reference in practical settings. Some users have pointed out that it serves well as an introductory text and provides adequate background knowledge for practical application. This blend of clarity and relevance seems to resonate particularly well within the geology community, as reflected in the positive reception from those who have purchased and used the book. **

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    Pros

    • Concise overview of SEM and microprobe techniques.
    • Focused on geological applications, making it practical for geologists.
    • Well-structured and easily readable.
    • Provides sufficient background without overwhelming technicality.

    Cons

    • Lacks in-depth exploration of the physics behind SEM and microprobe methods.

    Product Price History

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